Title :
Parametric yield estimation considering leakage variability
Author :
Rajeev R.Rao ; Devgan, Anirudh ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
University of Michigan, Ann Arbor, MI
Keywords :
Delay; Frequency; Integrated circuit reliability; Integrated circuit yield; Leakage current; Performance analysis; Process design; Subthreshold current; Threshold voltage; Yield estimation;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8