DocumentCode :
416283
Title :
Parametric yield estimation considering leakage variability
Author :
Rajeev R.Rao ; Devgan, Anirudh ; Blaauw, David ; Sylvester, Dennis
Author_Institution :
University of Michigan, Ann Arbor, MI
fYear :
2004
fDate :
7-11 July 2004
Firstpage :
442
Lastpage :
447
Keywords :
Delay; Frequency; Integrated circuit reliability; Integrated circuit yield; Leakage current; Performance analysis; Process design; Subthreshold current; Threshold voltage; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
ISSN :
0738-100X
Print_ISBN :
1-51183-828-8
Type :
conf
Filename :
1322522
Link To Document :
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