DocumentCode

416338

Title

Tradeoffs between gate oxide leakage and delay for dual T/sub ox/ circuits

Author

Sultania, Anup Kumar ; Sylvester, Dennis ; Sapatnekar, Sachin S.

Author_Institution

University of Minnesota, Minneapolis, MN

fYear

2004

fDate

7-11 July 2004

Firstpage

761

Lastpage

766

Keywords

CMOS technology; Circuits; Constraint optimization; Delay; Leakage current; MOS devices; Permission; Power generation; Tunneling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2004. Proceedings. 41st

Conference_Location

San Diego, CA, USA

ISSN

0738-100X

Print_ISBN

1-51183-828-8

Type

conf

Filename

1322584