Title :
Tradeoffs between gate oxide leakage and delay for dual T/sub ox/ circuits
Author :
Sultania, Anup Kumar ; Sylvester, Dennis ; Sapatnekar, Sachin S.
Author_Institution :
University of Minnesota, Minneapolis, MN
Keywords :
CMOS technology; Circuits; Constraint optimization; Delay; Leakage current; MOS devices; Permission; Power generation; Tunneling; Voltage;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8
