DocumentCode
416370
Title
On the generation of scan-based test sets with reachable states for testing under functional operation conditions
Author
Pomeranz, Kith
Author_Institution
Purdue University, W. Lafayette, IN
fYear
2004
fDate
7-11 July 2004
Firstpage
928
Lastpage
933
Keywords
Circuit faults; Circuit testing; Delay; Design for testability; Electrical fault detection; Fault detection; Logic testing; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location
San Diego, CA, USA
ISSN
0738-100X
Print_ISBN
1-51183-828-8
Type
conf
Filename
1322617
Link To Document