Title :
Combining dictionary coding and LFSR reseeding for test data compression
Author :
Sun, Xiaoyun ; Kinney, Larry ; Vinnakota, Bapiraju
Author_Institution :
University of Minnesota, Minneapolis, MN
Keywords :
Algorithm design and analysis; Automatic testing; Benchmark testing; Dictionaries; Equations; Fault tolerance; Permission; Sun; Test data compression; Vectors;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8