DocumentCode
416676
Title
Fault diagnosis in a class of concurrent discrete event systems
Author
Ukawa, Y. ; Ushio, Toshimitsu ; Takai, Shigemasa ; Yamamoto, Shigeru
Author_Institution
Graduate Sch. of Eng. Sci., Osaka Univ., Japan
Volume
3
fYear
2003
fDate
4-6 Aug. 2003
Firstpage
2360
Abstract
In this paper, we consider diagnosability of discrete event systems with simultaneous event occurrences, which we call concurrent discrete event systems. The systems have a problem that the number of event sets, which may occur concurrently, is increasing exponentially. So, it is difficult to design a diagnoser. We introduce a notion of concurrent well-posedness (CWP). We then prove that CWP is a necessary and sufficient condition for no effect of concurrency on the diagnosability in concurrent discrete event systems.
Keywords
diagnostic reasoning; discrete event systems; fault diagnosis; set theory; concurrent discrete event systems; concurrent well-posedness; event sets; fault diagnosis;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2003 Annual Conference
Conference_Location
Fukui, Japan
Print_ISBN
0-7803-8352-4
Type
conf
Filename
1323613
Link To Document