Particle element and size measurement using LIBS

Conventional particle size measurement are possible by calculations made from the average particle size. We have developed high-sensitivity-in-situ measurement technology based on photons with visible to ultraviolet wavelength bands. The developed system can measure an average of 100 measurements and also individual phenomena. This measurement technology builds on plasmatizing particles technology and a high-sensitivity measurement technology for measuring photons from the plasma. Thus, we have established a technology for measuring particle sizes down to 30 nm and the constituent element content of particles with 10% accuracy.