DocumentCode
417006
Title
Nonlinearity characteristics of radiation thermometers
Author
Ma, Laina ; Sakuma, Fumihiro
Author_Institution
Nat. Metrol. Inst. of Japan, AIST, Tsukuba, Japan
Volume
2
fYear
2003
fDate
4-6 Aug. 2003
Firstpage
1779
Abstract
Accurate calibration of radiation temperature requires knowledge of radiation thermometer nonlinearity. The nonlinearity at doubled incident radiation was measured at various radiance levels by using the dual aperture method. The scale deviation and uncertainty due to silicon detector nonlinearity were calculated. The expanded uncertainty due to the nonlinearity of a 0.65 /spl mu/m radiation thermometer scale was estimated as 0.04/spl deg/C at 2000/spl deg/C. The scale deviation of a 0.9 /spl mu/m radiation thermometer was 0.42/spl deg/C at 2000/spl deg/C.
Keywords
calibration; elemental semiconductors; silicon; temperature measurement; thermometers; 0.04 degC; 0.42 degC; 0.65 micron; 0.9 micron; 2000 degC; Si; calibration; doubled incident radiation; dual aperture method; nonlinearity; nonlinearity characteristics; radiance levels; radiation temperature; radiation thermometers; scale deviation; scale uncertainty; silicon detector;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2003 Annual Conference
Conference_Location
Fukui, Japan
Print_ISBN
0-7803-8352-4
Type
conf
Filename
1324249
Link To Document