DocumentCode
417082
Title
Thermal analysis simulation using depolarization loss in solid-state microchip laser
Author
Aoyagi, Y. ; Taira, Takunori ; Shoji, I.
Author_Institution
Ind. Technol. Center of Fukui Prefecture, Japan
Volume
2
fYear
2003
fDate
4-6 Aug. 2003
Firstpage
2195
Abstract
We have developed the analysis program based on a finite element (FE) method for the temperature distribution and thermally induced birefringence effect of the solid-state lasers. Numerical investigations for microchip laser have been carried out and evaluated with the measured depolarization losses, and we found that the errors between FE-based solutions and the measured values were less than 8%.
Keywords
birefringence; finite element analysis; light polarisation; microchip lasers; temperature distribution; thermal analysis; FEM; depolarization loss; finite element method; solid state microchip laser; temperature distribution; thermal analysis simulation; thermally induced birefringence effect;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2003 Annual Conference
Conference_Location
Fukui, Japan
Print_ISBN
0-7803-8352-4
Type
conf
Filename
1324325
Link To Document