Title :
An input-free NMOS VT extractor circuit in presence of body effects
Author_Institution :
Sch. of ECE, Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
An input-free NMOS VT (threshold voltage) extractor circuit in an n-well CMOS process is presented. The non-idealities due to NMOS body effects on the extracted VT are automatically compensated in the circuit. PMOS difference amplifiers are developed to compute the difference of node voltages such that the VT of the NMOS device can be extracted as a voltage, referenced to ground or VDD. The proposed NMOS V2 extractor circuit was fabricated in a 0.25 μm CMOS process, and the extracted VT, which had an absolute value of 0.441V, had an accuracy of 95.7%.
Keywords :
CMOS integrated circuits; MOSFET; differential amplifiers; 0.25 micron; 0.441 V; NMOS device; NMOS extractor circuit; PMOS difference amplifiers; body effects; n-well CMOS process; node voltages; threshold voltage; CMOS process; CMOS technology; Circuits; Curve fitting; Data mining; MOS devices; Monitoring; TV; Temperature sensors; Threshold voltage;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1328344