Title :
Susceptibility of digital ICs to ringing EMI events
Author :
Bridgwood, Michael A.
Author_Institution :
Holcombe Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
Abstract :
This study examines the susceptibility of idealized digital devices subjected to nondamaging rings at microwave frequencies. The device considered is a CMOS inverter whose susceptibility is linked to ring time of occurrence, frequency, amplitude and attenuation. The treatment considers unwanted excursions across the logic threshold as single logic breaches. In this paper, the device is considered to be in the logic input low state. Pulse overdrive specifications for commercial type AC devices are quantified via curve-fitting and the results extended to the case of the ring. It is shown that the voltage amplitude of the first positive ring peak required to cause a logic breach is approximately linear with increasing ring frequency. As ring frequency decreases, this susceptibility curve is shown to be asymptotic to the threshold voltage Vt.
Keywords :
CMOS digital integrated circuits; curve fitting; electromagnetic interference; integrated circuit noise; logic gates; logic simulation; CMOS inverter; IC ringing event susceptibility; curve-fitting; digital IC; logic breaches; logic threshold excursions; microwave frequency nondamaging rings; pulse overdrive specifications; ringing EMI events; threshold voltage; Attenuation; CMOS logic circuits; Curve fitting; Digital integrated circuits; Electromagnetic interference; Frequency; Inverters; Logic devices; Microwave devices; Voltage;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN :
0-7803-8302-8
DOI :
10.1109/APS.2004.1329814