A new circuit model for the analysis of frequency selective surfaces and volumes

Frequency selective surfaces/volumes (FSS/FSV) are periodic structures with frequency selective properties, and have been widely used for millimeter wave and microwave applications. Traditionally, the finite element-boundary integral method (FE-BI) has been the tool of choice for analyzing FSS/Vs. However, when the size of the geometry exceeds a couple of wavelengths, the number of unknowns increases to a level where the available computer resources become insufficient. Thus, the introduction of the alternative methods and models is necessary for simulating such structures. The paper introduces a new equivalent circuit model for the analysis of single/multiple layer frequency selective surfaces/volumes (FSS/Vs). The new model is based on the extraction of the resistivity parameters (Topsakal, E., et al., Radio Science, vol.48, no.11, 2002) of the FSS/V using the reflection and transmission data obtained through numerical simulations or measurements. In order to illustrate the theory, several FSS/V structures are considered.