• DocumentCode
    419155
  • Title

    The integral equation MEI (IE-MEI)

  • Author

    Rius, J.M. ; Parrón, J. ; Ùbeda, E. ; Heldring, Alex ; Mosig, J.R.

  • Author_Institution
    Dept. of TSC, Univ. Politecnica de Catalunya, Barcelona, Spain
  • Volume
    3
  • fYear
    2004
  • fDate
    20-25 June 2004
  • Firstpage
    2247
  • Abstract
    The integral equation formulation of the Measured Equation of Invariance (IE-MEI) can be considered as a special case of combined field integral equation (CFIE) discretized by the method of moments (MoM), in which the choice of different testing functions for the electric and magnetic fields results in an approximately sparse linear system to solve for the induced current, where most of the matrix elements can be neglected. These new testing functions are numerically derived by a procedure borrowed from the Measured Equation of Invariance (MEI) method, originally developed to find numerically the truncation boundary coefficients of finite difference and finite element meshes. A significant feature of numerically derived testing functions is that they are ´adaptive´, i.e., specific to the particular shape of the scatterer boundary and to the location of the function in the boundary.
  • Keywords
    S-matrix theory; electric field integral equations; electromagnetic wave scattering; magnetic field integral equations; method of moments; sparse matrices; CFIE; IE-MEI; Measured Equation of Invariance; MoM; adaptive testing functions; approximately sparse linear system; combined field integral equation; electric fields; induced current; integral equation MEI; magnetic fields; method of moments; scatterer boundary; testing functions; Current measurement; Differential equations; Electric variables measurement; Integral equations; Linear approximation; Linear systems; Magnetic field measurement; Moment methods; Sparse matrices; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2004. IEEE
  • Print_ISBN
    0-7803-8302-8
  • Type

    conf

  • DOI
    10.1109/APS.2004.1331817
  • Filename
    1331817