Title :
SVM-based classifier design with controlled confidence
Author :
Li, Mingkun ; Sethi, Ishwar K.
Author_Institution :
Dept. of Comput. Sci. & Eng., Oakland Univ., Rochester, MI, USA
Abstract :
A new classification methodology with controlled error rates and a reject option is proposed in this paper. The proposed methodology is implemented using support vector machine´s (SVM´s) posterior probability preserving property. A new nonparametric method is proposed to accurately estimate error rates from the output of a trained SVM. The experimental results clearly demonstrate the efficacy of the suggested classifier design methodology.
Keywords :
error statistics; nonparametric statistics; pattern classification; probability; support vector machines; SVM based classifier design; controlled confidence; controlled error rates; error rate estimation; nonparametric method; posterior probability; reject option; support vector machine; Computer science; Control systems; Design methodology; Error analysis; Error correction; Machine intelligence; Optimal control; Pattern recognition; Support vector machine classification; Support vector machines;
Conference_Titel :
Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
Print_ISBN :
0-7695-2128-2
DOI :
10.1109/ICPR.2004.1334037