• DocumentCode
    421016
  • Title

    The N-P-N structure with C60/p-Si heterojunctions

  • Author

    Berdinsky, A.S. ; Fink, D. ; Gridchin, V.A. ; Yoo, Ji Beom

  • Author_Institution
    Dept. of Mater. Eng., Sungkyunkwan Univ., South Korea
  • fYear
    2004
  • fDate
    1-5 July 2004
  • Firstpage
    27
  • Lastpage
    31
  • Abstract
    To form C60/p-Si heterojunction the thin fullerite film can be easily evaporated on the silicon substrate. In the case of two planar terminals on the fullerite film, there is an asymmetry in conductivities of thin fullerite layer in lateral, σL, and transverse, σT, directions of current flow, σL≪σT. This reason leads to path of the main current flow through one p-n heterojunction into the underlying silicon layer to the other p-n heterojunction, since the lateral component, IL, of current through the fullerite film still much less then transversal component, IT. In this way, a novel family of transistor-like electronic structures has been created. The basic characteristics of these structures named "FOS" (Fullerite on Silicon) are shown and explained simply. Since the lateral conductivity of fullerite film strongly depends on the ambient factors as humidity and chemical environmental, then the creation of sensors are possible. The combination of C60/p-Si heterojunction in n-p-n structure can be useful for the new type of transistors based on fullerite as prospective material for nanoelectronic devices.
  • Keywords
    elemental semiconductors; fullerene devices; fullerenes; gold; heterojunction bipolar transistors; nanoelectronics; semiconductor thin films; silicon; wide band gap semiconductors; Au-C60-Si; C60/p-Si heterojunctions; NPN structure; chemical environmental factors; conductivity asymmetry; current flow direction; fullerite film; fullerite on silicon structure; humidity; nanoelectronic devices; p-n heterojunction; planar terminals; sensors; silicon substrate; transistor-like electronic structures; Fullerenes; Gold; Heterojunction bipolar transistors; Semiconductor films; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Materials, 2004. Proceedings. 5th Annual. 2004 International Siberian Workshop on
  • Print_ISBN
    5-7782-0463-9
  • Type

    conf

  • DOI
    10.1109/PESC.2004.241012
  • Filename
    1358279