Title :
A simple post-processing technique to improve the retrieval accuracy of second-order nonlinearity profiles
Author :
Ozcan, Aydogan ; Digonnet, M.J.F. ; Kino, G.S.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
An iterative process known as the Fienup algorithm is applied to correct and improve the accuracy of the second-order optical nonlinearity profile of thin films. This post-processing technique is simple, fast and provides perfect agreement with experimental data.
Keywords :
iterative methods; nonlinear optics; optical films; optical information processing; thin films; Fienup algorithm; iterative process; post-processing technique; retrieval accuracy; second-order nonlinearity profiles; thin films;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
