• DocumentCode
    42172
  • Title

    Efficient Dithering Technique With Periodic Waveforms for RF Test and Characterization

  • Author

    Farsi, S. ; Remley, Kate A. ; Nauwelaers, B. ; Schreurs, Dominique

  • Author_Institution
    Electron. Eng. Dept., KU Leuven, Leuven, Belgium
  • Volume
    61
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    3998
  • Lastpage
    4007
  • Abstract
    A dithering technique based on ensemble averaging of waveforms is proposed. In the proposed method, we perform a single measurement of multiple periods of a sine-dithered periodic waveform, whereas in the existing ensemble averaging methods several different measurements with dithering additive noise are performed. The measured waveform is then segmented and the segments are averaged to obtain a noise-reduced post-processed waveform. This technique provides improved efficiency in test and characterization applications where accuracy higher than that of the built-in data converters of the measurement equipment is required. Moreover, we show that by using large dithering signals in the proposed technique, we can reduce the nonideal effects found in real applications. As an example, we show in a simulated example that by using the approach with an ensemble size of five in an ideal quantizer, we are able to reduce the mean-square error and adjacent channel distortion by 11 dB. A reduction of 6 dB is achieved when we use the same ensemble size in a nonideal quantizer. An experiment is then conducted to evaluate the reduction in the adjacent channel power of a modulated signal emanating from an arbitrary waveform, by using the proposed technique. The experimental results show that even for a modulated signal with 160-MHz bandwidth at 4.5 GHz, by using an ensemble size of four, we are able to reduce the adjacent channel distortion by 5 dB.
  • Keywords
    microwave measurement; quantisation (signal); RF characterization; RF test; adjacent channel distortion; bandwidth 160 MHz; characterization application; data converter; dithering additive noise; dithering technique; frequency 4.5 GHz; ideal quantizer; large dithering signal; mean square error; modulated signal; noise reduced post processed waveform; sine dithered periodic waveform; test application; Bandwidth; Noise; Noise measurement; Quantization (signal); Radio frequency; Temperature measurement; Time-domain analysis; Analog-to-digital converter (ADC); digital-to-analog converter (DAC); dithering; ensemble averaging; modulated-signal measurement; quantization noise; wireless system test;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2013.2283847
  • Filename
    6623183