DocumentCode
424445
Title
The Impact of Variability on Power
Author
Nassif, Sani R.
Author_Institution
IBM Austin Research Laboratory, Austin, TX
fYear
2004
fDate
11-11 Aug. 2004
Firstpage
350
Lastpage
350
Abstract
The integrated circuit manufacturing process has inevitable imperfections and fluctuations that result in ever-growing systematic and random variations in the electrical parameters of active and passive devices fabricated. The impact of such variations on various aspects of chip performance has been the subject of numerous papers, and techniques for analyzing a d dealing with such variability -broadly labelled design for manufacturability are emerging as the next hot topic in this area.
Keywords
Integrated Circuit; Power; Variability; Integrated Circuit; Power; Variability;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 2004. ISLPED '04. Proceedings of the 2004 International Symposium on
Conference_Location
Newport Beach, CA, USA
Print_ISBN
1-58113-929-2
Type
conf
Filename
1383017
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