DocumentCode
42655
Title
Flat Frequency Response in the Electronic Measurement of Boltzmann´s Constant
Author
Jifeng Qu ; Yunfeng Fu ; Jianqiang Zhang ; Rogalla, Horst ; Pollarolo, Alessio ; Benz, Samuel P.
Author_Institution
Nat. Inst. of Metrol., Beijing, China
Volume
62
Issue
6
fYear
2013
fDate
Jun-13
Firstpage
1518
Lastpage
1523
Abstract
A new quantum-voltage-calibrated Johnson noise thermometer was developed at the National Institute of Metrology to demonstrate the electrical approach that determines Boltzmann´s constant k, by comparing electrical and thermal noise power. A measurement with an integration period of 19 h and a bandwidth of 638 kHz results in a relative offset of 1 × 10-6, from the current Committee on Data for Science and Technology value of k, and a type A relative standard uncertainty of 17 × 10-6. Closely matched noise powers and transmission-line impedances were achieved, and consequently, the quadratic fitting parameters of the ratio spectrum show flat frequency responses with respect to the measurement bandwidth. This flat response produces a dramatically reduced systematic error compared to that of the National Institute of Standards and Technology measurement of k, in which the relative combined uncertainty was dominated by this error.
Keywords
calibration; constants; electric noise measurement; frequency response; impedance matching; measurement errors; measurement standards; measurement uncertainty; thermal noise; thermometers; voltage measurement; Boltzmann constant; Committee on Data for Science and Technology; National Institute of Metrology; National Institute of Standards and Technology; bandwidth 638 kHz; electrical noise power; electronic measurement; flat frequency response; measurement uncertainty; quadratic fitting parameter; quantum-voltage-calibrated Johnson noise thermometer; relative standard uncertainty; systematic measurement error; thermal noise power; time 19 h; transmission-line impedance; Bandwidth; Frequency measurement; NIST; Noise; Noise measurement; Resistors; Uncertainty; Correlation; Johnson noise; Josephson voltage standard; noise measurement; temperature measurement;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2013.2238431
Filename
6449322
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