DocumentCode :
428667
Title :
Optical metrology aimed for process quality-control-loops (QCL) in production-modules for micro-technology
Author :
Ubaldo, Aleriano ; Tilo, Pfeifer
Author_Institution :
Lab. for Machine Tools & Production Technol., Aachen Univ., Germany
Volume :
6
fYear :
2004
fDate :
10-13 Oct. 2004
Firstpage :
5417
Abstract :
A tendency for micro-systems production, which has been followed worldwide during the last years, consists in the miniaturization not only of the manufactured parts but also of the production equipments and specially the machine tools. Among many benefits, this reduction in size allows modular production, which fits well with the product-variety of microsystems. In order to strength the flexibility´ character of modular production, an adaptive system for inspection and quality control is needed. The goal of the research to be reported in this document is focused on the design, construction and implementation of an optical measuring device conceived as a modular and universal system for quality control and the integration of such a system into miniaturized production frameworks (microfactory) for micro-technology in order to create a complete process quality control loop.
Keywords :
machine tools; micromechanical devices; optical variables measurement; process control; quality control; machine tools; microtechnology; optical metrology; process quality control loops; production equipment; production modules; Adaptive systems; Machine tools; Manufacturing; Metrology; Optical devices; Production equipment; Production systems; Programmable control; Quality control; Quantum cascade lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man and Cybernetics, 2004 IEEE International Conference on
ISSN :
1062-922X
Print_ISBN :
0-7803-8566-7
Type :
conf
DOI :
10.1109/ICSMC.2004.1401055
Filename :
1401055
Link To Document :
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