DocumentCode
429061
Title
Simulation and extraction of single-trial evoked potentials
Author
Bansal, Pansy ; Sun, Mingui ; Sclabassi, Robert J.
Author_Institution
Dept. of Neurological Surg., Pittsburgh Univ., PA, USA
Volume
1
fYear
2004
fDate
1-5 Sept. 2004
Firstpage
200
Lastpage
203
Abstract
Evoked potentials are defined as potentials that result from electrical activity in the central nervous system after a stimulation. In analysis of evoked potentials the main problem is to extract the waveform from measurements that also contain on-going background electroencephalographic (EEG) activity. The conventional tool for the analysis of evoked potentials has been averaging of the measurements over an ensemble of trials. This is the optimal way to improve the signal-to-noise ratio when the evoked potential is a deterministic signal in independent and additive background noise of zero mean. However, it is evident that the evoked potential varies with repetitions of the stimuli. There are two aims of this paper. The first is to develop a simulation method for evoked potentials with slow variations among different trials. The second aim is to develop a method to extract time variations occurring in a number of time-aligned trials to estimate the single-trial evoked potentials.
Keywords
bioelectric potentials; electroencephalography; medical signal processing; neurophysiology; central nervous system; electrical activity; electroencephalography; single-trial evoked potentials; Additive noise; Background noise; Brain modeling; Central nervous system; Computational modeling; Data mining; Delay; Electroencephalography; Signal to noise ratio; Testing; Extraction; Simulation; Single-Trial Evoked Potential; Variations; Whiteness test;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-8439-3
Type
conf
DOI
10.1109/IEMBS.2004.1403126
Filename
1403126
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