• DocumentCode
    429069
  • Title

    Time-frequency analysis of visual evoked potentials by means of matching pursuit with chirplet atoms

  • Author

    Cui, J. ; Wong, W. ; Mann, S.

  • Author_Institution
    Inst. of Biomaterials & Biomedical Eng., Toronto Univ., Ont., Canada
  • Volume
    1
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    267
  • Lastpage
    270
  • Abstract
    Detection of visual evoked potentials (VEP) elicited by repetitive stimuli is valuable in both laboratorial research and clinical practice. Therefore, knowing the characteristics of VEPs is of fundamental importance for adequate design of a signal detector. Usually, the signal is modeled as a steady-state VEP (ssVEP) consisting of the fundamental frequency and the higher harmonics, while ignoring the information contained in its transients (tVEP). We propose here to characterize both tVEP and ssVEP by chirplet time-frequency representation of VEP signal using a matching pursuit (MP) algorithm. Compared to the time-frequency analysis with short-time-Fourier-transform (STFT) and linear-prediction-coding (LPC) method, MP with chirplet shows not only clear characteristics of ssVEP, but a clear spindle-like time-frequency component of tVEP as well, which is not obvious in the other two methods.
  • Keywords
    Fourier transforms; electroencephalography; linear predictive coding; medical signal processing; time-frequency analysis; visual evoked potentials; chirplet atoms; linear prediction coding; matching pursuit; short-time Fourier transform; steady-state visual evoked potentials; time-frequency analysis; Chirp; Detectors; Laboratories; Linear predictive coding; Matching pursuit algorithms; Pursuit algorithms; Signal design; Signal detection; Steady-state; Time frequency analysis; Visual evoked potential; chirplet atom; matching pursuit; time-frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1403143
  • Filename
    1403143