• DocumentCode
    429243
  • Title

    A new approach to current density impedance imaging

  • Author

    Hasanov, K.F. ; Ma, A.W. ; Yoon, R.S. ; Nachman, A.I. ; Joy, M.L.

  • Author_Institution
    Inst. of Biomater. & Biomed. Eng., Toronto Univ., Ont., Canada
  • Volume
    1
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    1321
  • Lastpage
    1324
  • Abstract
    Current density impedance imaging (CDII) is a new impedance imaging technique that utilizes current density vector measurements made using magnetic resonance imager (MRI). CDII provides a simple mathematical expression for the gradient of the logarithm of conductivity, ∇ln(σ), at each point in a region where two current density vector has been measured. From the images of the gradient of the logarithm of conductivity, ln(σ) can be reconstructed through integration and of σ by a priori knowledge of the conductivity at a single point in the object. The CDII technique was tested on a conductivity phantom made from tissue mimicking gel. The results showed accurate reconstruction of the gel conductivity from two current density measurements. This study, for the first time, has demonstrated a local reconstruction technique to calculate sample conductivity inside the phantom noninvasively.
  • Keywords
    biological tissues; biomedical MRI; current density; electric current measurement; electric impedance imaging; electrical conductivity measurement; gels; numerical analysis; phantoms; conductivity phantom; conductivity reconstruction; current density impedance imaging; current density vector measurement; gel conductivity; magnetic resonance imager; tissue mimicking gel; Conductivity measurement; Current density; Current measurement; Density measurement; Image reconstruction; Imaging phantoms; Impedance measurement; Magnetic resonance; Magnetic resonance imaging; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1403415
  • Filename
    1403415