DocumentCode
429292
Title
Model-based automated segmentation of kinetochore microtubule from electron tomography
Author
Jiang, Ming ; Ji, Qiang ; McEwen, Bruce F.
Author_Institution
Dept. of Electr. Comput. & Sci. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Volume
1
fYear
2004
fDate
1-5 Sept. 2004
Firstpage
1656
Lastpage
1659
Abstract
The segmentation of kinetochore microtubules from electron tomography is challenging due to the poor quality of the acquired data and the cluttered cellular surroundings. We propose to automate the microtubule segmentation by extending the active shape model (ASM) in two aspects. First, we develop a higher order boundary model obtained by 3-D local surface estimation that characterizes the microtubule boundary better than the gray level appearance model in the 2-D microtubule cross section. We then incorporate this model into the weight matrix of the fitting error measurement to increase the influence of salient features. Second, we integrate the ASM with Kalman filtering to utilize the shape information along the longitudinal direction of the microtubules. The ASM modified in this way is robust against missing data and outliers frequently present in the kinetochore tomography volume. Experimental results demonstrate that our automated method outperforms manual process but using only a fraction of the time of the latter.
Keywords
Kalman filters; biological techniques; cellular biophysics; electron microscopy; image segmentation; tomography; 3-D local surface estimation; Kalman filtering; active shape model; cluttered cellular surroundings; electron tomography; fitting error measurement; gray level appearance model; high order boundary model; kinetochore microtubule; model-based automated segmentation; Electrons; Image segmentation; Information filtering; Information filters; Kalman filters; Noise shaping; Robustness; Shape; Surface fitting; Tomography; Image segmentation; electron tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location
San Francisco, CA
Print_ISBN
0-7803-8439-3
Type
conf
DOI
10.1109/IEMBS.2004.1403500
Filename
1403500
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