Title :
Composite index for the quantitative evaluation of image segmentation results
Author :
Alonso, F. ; Algorri, M.E. ; FIores-Mangas, F.
Author_Institution :
Dept. of Digital Syst., Instituto Tecnologico Autonomo de Mexico, Mexico City, Mexico
Abstract :
Medical image segmentation is one of the most productive research areas in medical image processing. The goal of most new image segmentation algorithms is to achieve higher segmentation accuracy than existing algorithms. But the issue of quantitative, reproducible validation of segmentation results, and the questions: What is segmentation accuracy?, and: What segmentation accuracy can a segmentation algorithm achieve ? remain wide open. The creation of a validation framework is relevant and necessary for consistent and realistic comparisons of existing, new and future segmentation algorithms. An important component of a reproducible and quantitative validation framework for segmentation algorithms is a composite index that will measure segmentation performance at a variety of levels. We present a prototype composite index that includes the measurement of seven metrics on segmented image sets. We explain how the composite index is a more complete and robust representation of algorithmic performance than currently used indices that rate segmentation results using a single metric. Our proposed index can be read as an averaged global metric or as a series of algorithmic ratings that will allow the user to compare how an algorithm performs under many categories.
Keywords :
image segmentation; medical image processing; averaged global metric; composite index; medical image processing; medical image segmentation; Biomedical image processing; Biomedical imaging; Brain modeling; Fuzzy logic; Head; Image processing; Image segmentation; Pixel; Prototypes; Robustness; Error Index; Performance Evaluation; Quantitative Validation; Segmentation Results;
Conference_Titel :
Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8439-3
DOI :
10.1109/IEMBS.2004.1403536