• DocumentCode
    42956
  • Title

    Control of the Microstructure of FePt-SiN _{\\rm x} -C (001) Film by a Nucleation Layer Grown on TiN Intermediate Layer

  • Author

    Li, Hai Helen ; Dong, K.F. ; Chow, G.M. ; Chen, Jim S.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • Volume
    49
  • Issue
    7
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    3299
  • Lastpage
    3302
  • Abstract
    The microstructure and magnetic properties of granular FePt-SiNx-C films were modified by introducing an MgO nucleation layer grown on the TiN intermediate layer. It was found that the deposition of an ultra-thin MgO nucleation layer could reduce the FePt grain size, narrow grain size distribution and improve grain isolation by creating more nucleation sites. When MgO nucleation layer thickness varied from 0 to 0.36 nm, FePt grain size was reduced from 8.51 nm to 7.18 nm and the standard deviation of the grain size distribution was narrowed from 2.16 nm to 1.51 nm. Good L10 (001) texture was maintained and large out-of-plane coercivity (27.5 kOe) was obtained at the MgO thickness of 0.36 nm. Meanwhile, Δθ50 of FePt (001) peak decreased from 7.1° to 6.4°, indicating the improved easy axis distribution of FePt grains. However, with the further increase of the MgO nucleation layer thickness, MgO nuclei developed into a continuous layer, FePt (111) orientation appeared and the perpendicular magnetic anisotropy was deteriorated.
  • Keywords
    carbon; coercive force; crystal orientation; grain size; iron compounds; magnesium compounds; nucleation; perpendicular magnetic anisotropy; silicon compounds; thin films; titanium compounds; FePt (111) orientation; FePt-SiNx-C; MgO; MgO nucleation layer growth; TiN; TiN intermediate layer; continuous layer; grain isolation; grain size; granular films; magnetic properties; microstructure; out-of-plane coercivity; perpendicular magnetic anisotropy; size 0.36 nm; standard deviation; ultrathin MgO nucleation layer; Coercive force; Grain size; Magnetic hysteresis; Magnetic recording; Microstructure; Tin; X-ray scattering; FePt thin film; MgO nucleation layer; TiN intermediate layer; perpendicular magnetic media;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2013.2242433
  • Filename
    6559342