An investigation of losses in microstrip lines

This paper addresses the characterization of the sources of microstrip line losses by varying the surface roughness, loss tangent, dielectric constant and the height of the substrates. This is done by using simulations of microstrip line test circuits. Then, the test circuits are modeled using different type of substrates. Measurements are carried out by using a vector network analyzer to make comparisons between measurement results and simulation results. All the results substantially verify the theory.