Title :
Ultrasonic flaw detection using discrete wavelet transform for NDE applications
Author :
Oruklu, Erdal ; Saniie, Jafar
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
Abstract :
In this work, we analyze signal decomposition properties of discrete wavelet transform (DWT) for enhanced ultrasonic flaw detection. In wavelet signal decomposition, a collection of time-frequency representations of the signal with different resolutions is obtained. DWT allows to utilize both time and frequency domain information for compacting and decorrelating the flaw echo from clutter echoes. In this paper, we present the performance analysis of different wavelet kernels with respect to ultrasonic NDE applications and develop the wavelet selection criteria for optimal flaw detection. Experimental results indicate that DWT based flaw detection algorithms offer flaw-to-clutter ratio enhancement of 5-12 dB when the measured flaw-to-clutter ratio is 0 dB or less. DWT flaw detection system can be implemented efficiently for real time applications using reconfigurable architecture and lifting scheme.
Keywords :
acoustic signal processing; clutter; discrete wavelet transforms; flaw detection; signal representation; signal resolution; time-frequency analysis; ultrasonic materials testing; DWT; NDE applications; clutter echoes; discrete wavelet transform; flaw echo decorrelation; flaw-to-clutter ratio enhancement; frequency domain information; lifting scheme; nondestructive evaluation; optimal flaw detection; real time applications; reconfigurable architecture; signal resolution; time domain information; time-frequency signal representation; ultrasonic NDE applications; ultrasonic flaw detection; wavelet kernels; wavelet selection criteria; wavelet signal decomposition; Decorrelation; Detection algorithms; Discrete wavelet transforms; Frequency domain analysis; Kernel; Performance analysis; Signal analysis; Signal resolution; Time frequency analysis; Wavelet analysis;
Conference_Titel :
Ultrasonics Symposium, 2004 IEEE
Print_ISBN :
0-7803-8412-1
DOI :
10.1109/ULTSYM.2004.1417956