• DocumentCode
    432371
  • Title

    Secondary electron emission of dielectric materials under high emperature condition

  • Author

    Suharyanto ; Michizono, S. ; Yamano, Y. ; Saito, Y. ; Kobayashi, S.

  • Author_Institution
    Department of Electrical Engineering, Cadjah Mada University, JI. Grafika 2, Yogyakarta, 55281, Indonesia
  • Volume
    1
  • fYear
    2004
  • fDate
    Sept. 27 2004-Oct. 1 2004
  • Firstpage
    21
  • Lastpage
    24
  • Abstract
    Secondary electron emission (SEE) coefficients of alumina, sapphire; Si02, and MgO were measured by using a SEM with short-pulsed electron beam under room and high temperatures. An appreciable reduction in the SEE coefficients with increasing temperature was confirmed, except for sapphire. In addition, it was found that at room and high temperature SEE coefficients of alumina increased with purity and grain size.
  • Keywords
    Acceleration; Ceramics; Dielectric materials; Electromagnetic heating; Electron emission; Flashover; Insulation; Klystrons; Scanning electron microscopy; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2004. Proceedings. ISDEIV. XXIst International Symposium on
  • Conference_Location
    Yalta, Crimea
  • ISSN
    1093-2941
  • Print_ISBN
    0-7803-8461-X
  • Type

    conf

  • DOI
    10.1109/DEIV.2004.1418590
  • Filename
    1418590
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=432371