DocumentCode
434146
Title
Measurement and identification of parameters of the microwave transistors in the mode of high signal.
Author
Kudryavtsev, A.M. ; Malyshev, I.N. ; Nikulin, S.M. ; Prostakov, V.A.
fYear
2004
fDate
21-24 Sept. 2004
Firstpage
230
Lastpage
230
Abstract
The solution for the correct reconstruction of S-parameters of SHF transistors in large signal mode using the results of measurements on strip lines having arbitrary wave resistance is proposed. The results of measurements of a transistor are obtained by simulation in program package Microwave Office.
Keywords
Circuits; Electrical resistance measurement; Electromagnetic heating; Fabrication; Microwave measurements; Microwave transistors; Resistance heating; Scattering parameters; Signal processing; Stability analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location
Novosibirsk, Russia
Print_ISBN
0-7803-8476-8
Type
conf
Filename
1427296
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