DocumentCode :
434167
Title :
Apparatus for measuring of dielectric structures with internal inhomogeneities
fYear :
2004
fDate :
21-24 Sept. 2004
Firstpage :
235
Lastpage :
235
Abstract :
Apparatus for measuring of dielectric structures with internal inhomogeneities is based on combination of multifrequency measurements and transversal scanning. Longitudinal distance dependencies of reflectivity are obtained by synthesis from multifrequency data. The multifrequency measurements in range 38-52 GHz and synthesis are done in real-time using measuring modules of scalar reflectometer of series P2 (R2). Combination of data in longitudinal and transversal directions produces radio images of dielectric structures with embedded objects. Some results of testinga are presented.
Keywords :
Ceramics; Dielectric measurements; Force measurement; Geophysical measurements; Glass; Microwave devices; Microwave measurements; Optical sensors; Permittivity measurement; Polyethylene;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Instrument Engineering Proceedings, 2004. APEIE 2004. 2004 7th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
0-7803-8476-8
Type :
conf
Filename :
1427321
Link To Document :
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