Measurement of the supply-current and internal impedance of VLSIs in a wide frequency range

Author

Held, Joachim ; Unger, Bernhard

Author_Institution

SIEMENS AG, Munich

Volume

1

fYear

2003

fDate

16-16 May 2003

Firstpage

101

Abstract

In order to simulate the emission of PCBs (printed circuit boards) it is necessary to describe the RF-(radio-frequency)-sources very exactly in a wide frequency range. Due to internal switching of VLSIs a lot of RF-noise can be seen on their supply-pins. These currents I(f) are dependent on the relationship between the impedance Z(f) of the supply-system of the VLSI and Z(f) into the supply-system of the PCB at the supply-pins of the VLSI. This paper describes an effective method to measure both Z(f) and I(f) of the VLSI and compares it to extraction of Z(f) from the VLSI´s geometrical data

Keywords

VLSI; electric current measurement; electric impedance measurement; electromagnetic compatibility; printed circuits; radiofrequency interference; RF sources; RF-noise; VLSI internal switching; VLSI supply-pins; VLSI-supply-current; VLSI-supply-impedance; emission simulation; impedance simulation; internal impedance measurement; printed circuit boards; radiofrequency sources; supply-current measurement; Calibration; Electronic mail; Frequency measurement; Impedance measurement; Joining processes; Measurement uncertainty; Performance evaluation; Position measurement; Reflection; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2003. EMC '03. 2003 IEEE International Symposium on

Conference_Location

Istanbul

Print_ISBN

0-7803-7779-6

Type

conf

DOI

10.1109/ICSMC2.2003.1428204

Filename

1428204