• DocumentCode
    435100
  • Title

    IR drop and ground bounce awareness timing model

  • Author

    Shao, Muzhou ; Gao, Youxin ; Yuan, Li-Pen ; Wong, Martin D F

  • Author_Institution
    Synopsys Inc., Mountain View, CA, USA
  • fYear
    2005
  • fDate
    11-12 May 2005
  • Firstpage
    226
  • Lastpage
    231
  • Abstract
    As the IC technology scales down, the effect of IR drop/ground bounce becomes increasingly significant. IR drop and ground bounce can compromise the gate driving capability and degrade the IC performance, and even can make IC functional failures. Hence, it is crucial to capture this effect efficiently and accurately in order to improve circuit reliability. In this paper, we proposed a timing model with consideration of IR drop and ground bounce. Our model can be derived directly from the existing timing tables (e.g. Synopsys.db or CLF tables), which are used in normal timing analysis. Compared with the traditional k-factor approach, our method does not require SPICE netlist and SPICE simulations. Moreover, the accuracy of our model is better than k-factor approach.
  • Keywords
    circuit simulation; integrated circuit modelling; integrated circuit reliability; logic design; timing; IR drop-and-ground bounce awareness timing model; circuit reliability; timing analysis; Circuits; Curve fitting; Degradation; Delay effects; Polynomials; Runtime; SPICE; Timing; Transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2005. Proceedings. IEEE Computer Society Annual Symposium on
  • Print_ISBN
    0-7695-2365-X
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2005.44
  • Filename
    1430137