DocumentCode
435793
Title
Technology for three dimensional integrated system-on-a-chip
Author
Kurino, Hiroyuki ; Koyanagi, Mitsumasa
Author_Institution
Dept. of Bioeng. & Robotics, Tohoku Univ., Sendai, Japan
Volume
1
fYear
2004
fDate
18-21 Oct. 2004
Firstpage
599
Abstract
We have proposed a wafer stacking technology to integrate various kinds of devices into 3D SoC. In 3D SoC each circuit layer is stacked and electrically connected vertically using a huge number of vertical interconnection. Hence, we can dramatically increase the wiring connectivity, reduce the number of long wiring and integrate various kinds of devices with different fabrication process sequences into one chip. In this paper, we describe a 3D microprocessor test chip consisting of three circuit layers and demonstrate the basic operation of the 3D microprocessor.
Keywords
integrated circuit design; integrated circuit interconnections; microprocessor chips; system-on-chip; 3D integrated system-on-a-chip; 3D microprocessor test chip; circuit layer stacking; fabrication process sequence; vertical interconnection; wafer stacking technology; wiring connectivity; Circuit testing; Fabrication; Integrated circuit interconnections; Integrated circuit technology; Random access memory; Stacking; System-on-a-chip; Wafer bonding; Wire; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN
0-7803-8511-X
Type
conf
DOI
10.1109/ICSICT.2004.1435077
Filename
1435077
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