• DocumentCode
    435793
  • Title

    Technology for three dimensional integrated system-on-a-chip

  • Author

    Kurino, Hiroyuki ; Koyanagi, Mitsumasa

  • Author_Institution
    Dept. of Bioeng. & Robotics, Tohoku Univ., Sendai, Japan
  • Volume
    1
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    599
  • Abstract
    We have proposed a wafer stacking technology to integrate various kinds of devices into 3D SoC. In 3D SoC each circuit layer is stacked and electrically connected vertically using a huge number of vertical interconnection. Hence, we can dramatically increase the wiring connectivity, reduce the number of long wiring and integrate various kinds of devices with different fabrication process sequences into one chip. In this paper, we describe a 3D microprocessor test chip consisting of three circuit layers and demonstrate the basic operation of the 3D microprocessor.
  • Keywords
    integrated circuit design; integrated circuit interconnections; microprocessor chips; system-on-chip; 3D integrated system-on-a-chip; 3D microprocessor test chip; circuit layer stacking; fabrication process sequence; vertical interconnection; wafer stacking technology; wiring connectivity; Circuit testing; Fabrication; Integrated circuit interconnections; Integrated circuit technology; Random access memory; Stacking; System-on-a-chip; Wafer bonding; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1435077
  • Filename
    1435077