• DocumentCode
    435794
  • Title

    The effect of pretreatment process on electroless nickel bumping for different Al pads

  • Author

    Fu, Xiao-Chen ; Guo-Wei Xiao ; Law, Pui-Chung ; Chan, Philip Ching Ho

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, China
  • Volume
    1
  • fYear
    2004
  • fDate
    18-21 Oct. 2004
  • Firstpage
    603
  • Abstract
    We present a study on optimization of pretreatment process of the electroless plating to obtain good aspect and process steadiness of nickel UBM on different aluminum surface morphology. Pitch 250μm and circular Al pads with 85μm opening in the passivation layer were prepared for our study. Six kinds of aluminum pads were produced by the sputtering system: Varian-3180. The compounds of the Al targets were 98.95%Al-1%Si-0.05%Ti in the Varian sputtering system and some set parameters of sputtering system were varied, the heterogeneous surface morphology of aluminum samples was gained in our research. All the samples underwent the electroless zinc/nickel/gold plating with low kinds of different pretreatments. The effect of aluminium surface morphology on the nickel UBM was observed. The results demonstrated that the pretreatment of Al pad surface by heat sodium hydroxide and mixed acid provided denser zinc seeds. That led to better electroless nickel plating. The reasonable and acceptable pretreatment of Al pad surface is critical for the nickel UBM.
  • Keywords
    aluminium; electroless deposition; etching; flip-chip devices; gold; nickel; sputtering; surface morphology; zinc; 250 micron; 85 micron; Al-Si-Ti; Au; Ni; Varian-3180 sputtering system; Zn; aluminium surface morphology; aluminum pads; circular Al pads; denser zinc seeds; electroless gold plating; electroless nickel bumping; electroless nickel plating; electroless zinc plating; flip-chip; heat sodium hydroxide; heterogeneous surface morphology; micro-etching; mixed acid; nickel UBM; passivation layer; pretreatment process; Aluminum oxide; Artificial intelligence; Atherosclerosis; Electronics packaging; Nickel; Passivation; Shape; Sputtering; Surface morphology; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
  • Print_ISBN
    0-7803-8511-X
  • Type

    conf

  • DOI
    10.1109/ICSICT.2004.1435078
  • Filename
    1435078