Measuring electronic transport in a single carbon nanotube inside the SEM

Author

Chen, Q. ; Wang, S. ; Liang, X.-L. ; Gao, S. ; Wang, M.S. ; Peng, L.-M.

Author_Institution

Dept. of Electron., Peking Univ., Beijing, China

Volume

1

fYear

2004

fDate

18-21 Oct. 2004

Firstpage

640

Abstract

Direct measurements on the electronic transport in a single carbon nanotube (CNT) were carried out inside the scanning electron microscope (SEM) using a nanoprobes system. Good contacts have been established between the probing nanotip and the CNT, and field effect on the current-voltage (I-V) curves has been demonstrated using a nanoprobe as a gate. Our results show that by using a nanoprobes system it is possible to perform reliably the electronic transport measurements on nanostructures of various shape and composition that are visible in the SEM.

Keywords

carbon nanotubes; electrical conductivity; electrical conductivity measurement; nanostructured materials; scanning electron microscopy; current-voltage curve; electronic transport measurement; field effect; nanoprobes system; nanostructures; scanning electron microscope; single carbon nanotube; Carbon nanotubes; Electrodes; Electron beams; Lithography; Nanostructures; Nanowires; Performance evaluation; Scanning electron microscopy; Shape measurement; Substrates;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on

Print_ISBN

0-7803-8511-X

Type

conf

DOI

10.1109/ICSICT.2004.1435086

Filename

1435086