DocumentCode :
435850
Title :
SiGe HBT design tradeoffs between small signal and large signal RF performance
Author :
Niu, Guofu ; Pan, Jun
Author_Institution :
Electr. & Comput. Eng. Dept., Auburn Univ., AL, USA
Volume :
3
fYear :
2004
fDate :
18-21 Oct. 2004
Firstpage :
2108
Abstract :
The paper examines the inherent SiGe HBT design tradeoffs between small signal and large signal RF performance for the first time. A higher Ge content and a higher Ge gradient in the base are typically desired to reduce RF noise figure, 1/f noise, phase noise, and to improve fT/fmax. This, however, requires the use of less Ge retrograding into the collector, which worsens high injection performance, and could degrade large signal output power and power added efficiency. Similarly, the use of a high breakdown voltage device for a higher output voltage swing could inadvertently hurt large signal output power because of a decreased current handling capability. Measurements on 200 GHz peak fT HBTs show that excellent large signal output power and power added efficiency can be achieved for 20 GHz operation, despite the inevitable breakdown voltage decrease with scaling.
Keywords :
1/f noise; Ge-Si alloys; heterojunction bipolar transistors; microwave transistors; phase noise; semiconductor device noise; semiconductor heterojunctions; 1/f noise; 20 GHz; RF noise figure; SiGe; high breakdown voltage device; large signal output power; output voltage swing; phase noise; silicon-germanium HBT design tradeoffs; small signal performance; Germanium silicon alloys; Heterojunction bipolar transistors; Noise figure; Noise reduction; Phase noise; Power generation; RF signals; Radio frequency; Signal design; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuits Technology, 2004. Proceedings. 7th International Conference on
Print_ISBN :
0-7803-8511-X
Type :
conf
DOI :
10.1109/ICSICT.2004.1435260
Filename :
1435260
Link To Document :
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