DocumentCode
43625
Title
Measurement of Gain Spectra of Semiconductor Lasers Using Least Squares Fitting Method
Author
Minming Zhang ; Deming Liu ; Makino, Tatsuya
Author_Institution
Nat. Eng. Lab. for Next Generation Internet Access Syst., Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume
25
Issue
12
fYear
2013
fDate
15-Jun-13
Firstpage
1122
Lastpage
1124
Abstract
A new technique for the measurement of net modal gain spectra of semiconductor lasers is presented. The technique is based on a least squares curve fitting to each longitudinal mode of amplified spontaneous emission spectrum. The errors of measurement over a wide wavelength range because of the asymmetric shape of individual mode and the limit resolution of the optical spectrum analyzer are greatly reduced, compared with those of conventional methods.
Keywords
least mean squares methods; measurement errors; semiconductor lasers; amplified spontaneous emission spectrum; asymmetric shape; conventional methods; gain spectra measurement; least squares fitting method; longitudinal mode; measurement errors; net modal gain spectra; optical spectrum analyzer; semiconductor lasers; wide wavelength range; Amplified spontaneous emission (ASE); gain measurement; least squares methods; semiconductor lasers;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2013.2260532
Filename
6512028
Link To Document