DocumentCode
436710
Title
Identification of radiation-induced parasitic leakage paths using light emission microscopy
Author
Shaneyfelt, Marty R. ; Tangyunyong, Paiboon ; Hill, Thomas A. ; Soden, Jeny M. ; Flores, Richard S. ; Schwank, James R. ; Dodd, Paul E. ; Hash, Gerald L.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
113
Lastpage
117
Keywords
CMOS technology; Degradation; Integrated circuit technology; Integrated circuit testing; Leakage current; Manufacturing processes; Microscopy; Process design; Radiation hardening; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442410
Link To Document