• DocumentCode
    436714
  • Title

    Use of Cf252 isotope facility to unfold SEU cross section in integrated circuits

  • Author

    Zinchenko, V.F. ; Derevjanko, Y.B. ; Lipsky, A.K.

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    141
  • Lastpage
    145
  • Keywords
    Circuit simulation; Circuit testing; Cyclotrons; Integrated circuit modeling; Integrated circuit testing; Ion beams; Isotopes; Laboratories; Life estimation; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442419
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436714