Current annealing of irradiated CMOS integrated circuits

Author

Bogatyrev, Yuri V. ; Korshunov, Fedor P.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

163

Lastpage

174

Keywords

Annealing; CMOS integrated circuits; Dielectrics; Electrons; Helium; Ionizing radiation; Lattices; MOS devices; Temperature; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

Filename

1442425

Link To Document