DocumentCode
436733
Title
Single event effects characterization of 16K x 9 fifo
Author
Marec, Ronan ; Ribeiro, Paul ; Cresciucci, Laetitia ; Barillot, Catherine ; Chatty, C. ; Calvel, Philippe
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
269
Lastpage
272
Keywords
CMOS process; CMOS technology; Chemical technology; Event detection; Logic devices; Read-write memory; Single event upset; Space technology; Testing; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442452
Link To Document