Experimental study of single-event transient current in SOI devices

Author

Hirao, T. ; Shibata, T. ; Laird, J.S. ; Onoda, S. ; Takabashi, Y. ; Ohnishi, K. ; Kamiya, T.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

305

Lastpage

309

Keywords

Charge measurement; Computational modeling; Computer simulation; Current measurement; Doping; Ion beams; MOS capacitors; Oxygen; Satellites; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

Filename

1442461

Link To Document