DocumentCode
436754
Title
40 simplified one parameter proton-induced SEU cross section dependence
Author
Chumakov, A.I.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
415
Lastpage
418
Keywords
Artificial intelligence; CMOS integrated circuits; Computer simulation; Energy exchange; Ion accelerators; Ion beams; Particle scattering; Protons; Single event upset; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442495
Link To Document