DocumentCode
436755
Title
Proton induced damage in JFET transistors and charge preamplifiers on high-resistivity silicon
Author
Betta, Gian Franco Dalla ; Manghisoni, Massimo ; Ratti, Lodovico ; Re, Valerio ; Speziali, Valeria ; Traversi, Gianluca ; Candelori, Andrea
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
419
Lastpage
424
Keywords
Circuits; Detectors; Fabrication; MOSFETs; Preamplifiers; Protons; Sensor phenomena and characterization; Signal processing; Silicon; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442496
Link To Document