DocumentCode
436759
Title
Effect of high-temperature electron irradiation in deep submicron MOSFETs
Author
Hayama, K. ; Ohyanm, H. ; Takakura, K. ; Simoen, E. ; Mercha, A. ; Claeys, C.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
443
Lastpage
448
Keywords
CMOS technology; Degradation; Dielectric materials; Electric variables measurement; Electrons; MOSFETs; Materials reliability; Space technology; Temperature distribution; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442502
Link To Document