Title :
The effect of different biasing configurations on radfet response measured by automated read-out system
Author :
Jaksic, A. ; Kimoto, Y. ; Ogourtsov, V. ; Polischuk, V. ; Mohammadzadeh, A. ; Mathewson, A.
Keywords :
Aerospace industry; Circuits; Current measurement; Energy consumption; Fading; MOSFETs; Real time systems; Research and development; Space charge; Switches;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
