• DocumentCode
    436775
  • Title

    Compendia of TID and see test results of space qualified integrated circuits

  • Author

    Lavton, P. ; Williamson, G. ; Patnaude, E. ; Longden, L. ; Thibodeau, C. ; Kazak, B. ; Sloan, C.

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    547
  • Lastpage
    552
  • Keywords
    Circuit testing; Cyclotrons; Integrated circuit technology; Integrated circuit testing; Ion accelerators; Performance evaluation; Production; Radiation effects; Space technology; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442535
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436775