DocumentCode
436776
Title
TID performance degradation of high precision, 16-bit analog-to-digital converters
Author
Layton, P. ; Williamson, G. ; Patnaude, E. ; Longden, L. ; Thibodeau, C.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
553
Lastpage
557
Keywords
Analog-digital conversion; Circuits; Data analysis; Degradation; Linearity; Performance evaluation; Production; Protection; Software testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442536
Link To Document