DocumentCode :
436776
Title :
TID performance degradation of high precision, 16-bit analog-to-digital converters
Author :
Layton, P. ; Williamson, G. ; Patnaude, E. ; Longden, L. ; Thibodeau, C.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
553
Lastpage :
557
Keywords :
Analog-digital conversion; Circuits; Data analysis; Degradation; Linearity; Performance evaluation; Production; Protection; Software testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442536
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436776
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