Updating the X-dose enhancement factor in recent technologies

Author

Azals, B. ; Charre, Ph. ; Barillot, C.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

579

Lastpage

585

Keywords

Belts; Circuit testing; Dissolved gas analysis; Electrons; Explosions; Packaging; Satellites; Silicon; Space technology; X-rays;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

Filename

1442542

Link To Document