• DocumentCode
    437117
  • Title

    Thermal design considerations for voltage regulator modules

  • Author

    Ball, Arthur ; Zhou, Jinghai ; Lee, Fred C.

  • Author_Institution
    Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech Inst. & State Univ., Blacksburg, VA
  • Volume
    1
  • fYear
    2005
  • fDate
    6-10 March 2005
  • Firstpage
    134
  • Abstract
    With increasing power density being a main goal in VRM designs today, thermal considerations are mounting in importance. A good thermal model of the VRM is therefore necessary to assure its reliability. This paper develops modeling strategies for traces, layers, and components; outlines thermal issues for the PCB and devices; and takes a look at alternate layouts that improve thermal performance without affecting electrical design goals. Effects of airflow, trace representations, and board-to-ambient resistance are addressed since these are the key thermal components. Experimental verification using a 1 MHz 1U non-isolated self-driven VRM is shown to validate the modeling techniques used. These results are then used in conjunction with electrical requirements to develop a PCB trace design guide for VRMs. This guide builds on the outdated IPC-22 21 standard by including more complex conditions bringing it closer to today´s real situations. Accurately determining the optimal trace specifications should improve thermal and electrical performance
  • Keywords
    cooling; design engineering; thermal management (packaging); voltage regulators; PCB; airflow; board-to-ambient resistance; power density; thermal performance; trace representation; voltage regulator module; Electronic packaging thermal management; Electronics cooling; Power electronics; Power system modeling; Regulators; Thermal engineering; Thermal management of electronics; Thermal resistance; Topology; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2005. APEC 2005. Twentieth Annual IEEE
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-8975-1
  • Type

    conf

  • DOI
    10.1109/APEC.2005.1452903
  • Filename
    1452903